Experimental study on novel composite phase change
A scanning electron microscopy (SEM) system (Zeiss, Germany) was used in analyzing the microstructures of the CPCMs at an accelerated voltage of 20 KV. The storage modulus, which can show the rigidity of a CPCM, was analyzed through dynamic thermomechanical analysis (DMA, Q800, TA Instruments, US). 2.4. Battery module and …
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